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Laboratory setup and configuration requirements
Application note for Performance of compact visual displays — measuring angular reflectance of optically active materials using the Agilent Cary 7000 Universal Measurement Spe
| Japanese (Japan) | Complete (PDF) |
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| Korean (Korea) | Complete (PDF) |
The Agilent 5100 Synchronous Vertical Dual (SVDV) revolutionizes ICP-OES analysis. Learn how SVDV works with unique Dichroic Spectral combiner technology.
The Agilent 5100 Synchronous Vertical Dual (SVDV) revolutionizes ICP-OES analysis. Learn how SVDV works with unique Dichroic Spectral combiner technology.
Agilent’s Fitted Background Correction (FBC) takes the guesswork out of background correction. No matter what your sample challenge may be.
In reversed-phase liquid chromatography, pH and ionic strength of the aqueous portion of mobile phases are important in developing rugged method
Application note for Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging
| Chinese (Simplified) (United States) | Complete (PDF) |
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Combining signals from two DADs with different path length flow cells, the 1200 Infinity Series HDR-DAD Analyzer enables analysis of main and trace compounds in a single run
Learn about the benefits of a vertically oriented torch—fast, accurate results, even for your toughest samples
Application note for monitoring heavy metals by atomic absorption spectroscopy for compliance with RoHS and WEEE Directives
This Technical Overview describes a LC system with 3 detectors in a multi-user environment operated with Agilent MassHunter Walkup Software for LC/MS and LC systems.
安捷倫科技從未停止對更快、更智能的 CCD 檢測器系列的創(chuàng)新和研發(fā)。
Detailing methods and practices of FT-IR microscopy and imaging for failure analysis in electronics manufacturing.
Basic Performance of the Agilent 7700s ICP-MS for the Analysis of Semiconductor Samples
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Application note for the analysis of electroceramics using laser ablation ICP-MS
Learn the reasons why the Agilent 7900s single quadrupole ICP-MS is ideal for measuring contaminants in semiconductor manufacturing chemicals
Atomic spectroscopy training presentation - hardware.
A guide to measuring trace elements and metal contaminants in semiconductor fabrication
Learn about the Agilent range of AA, MP-AES, ICP-OES, ICP-MS and ICP-QQQ instruments
| French (France) | Complete (PDF) |
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| Russian (Russia) | Complete (PDF) |
| Russian (Russia) | Complete (PDF) |
Agilent’s proprietary Fast Automated Curve-fitting Technique (FACT) provides accurate background correction, enabling you to analyze spectrally complex samples with confidence